Abstract
The purpose of this paper is to survey and assess recent trends in the field of detector materials for infrared focal plane arrays (IRFPAs) applicable in high-performance thermal imaging systems. Considered are II-VI, III-V and IV-VI compounds (including hetero structures and superlattices) with respect to their actual and potential performance, reliability and producibility. Addressed are growth methods for thin films of high uniformity as regards physical, optical, and electrical properties. The main efforts are found presently to concentrate on establishing growth methods for material systems and structures appropriate for more efficient manufacturing of IRFPAs. It is concluded that HgCdTe continues to be the most important material for infrared imaging in the wavelength region between 8 and 12 μm.
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