Abstract
Recent photon-counting pixel detectors offer the possibility to discern single photons of an X-ray flux. These detectors are highly complex electronic systems with hundreds of transistors in each pixel. In future these detectors may become even more complex and be able to also measure the energy of each incoming photon. This raises the question as to what can be done with this additional information. We developed an algorithm to reconstruct the area mass concentration of a material along the direction of the X-rays by their characteristic energy-dependent attenuation. We have used a likelihood approach for this material analysis method. In order to estimate the feasibility of our approach we investigated this material reconstruction technique in two different Monte-Carlo simulation cases with the X-ray simulation tool ROSI. We used the additionally attained information of area mass concentration of materials to colour traditional X-ray images.
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