Abstract
Abstract Ion optics of a mass spectrometer using magnetic and electric sector fields is discussed. The possibilities of correcting for all second order image aberrations of a stigmatic double focusing mass spectrometer are investigated using the computer program TRIO. Several examples are proposed and two of them have been constructed. The second and third order aberration coefficients measured experimentally were in good agreement with the calculated values. A virtual image type mass spectrometer with a toroidal condenser of c > 2 is useful to obtain high transmission and high resolution ( c is defined as the ratio of the radius of curvature in the median plane and that in the plane perpendicular to ion path). A new ion optical system having small image magnification (0.1) and second order stigmatic focusing is proposed.
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