Abstract
An x-ray scanning apparatus with an energy dispersive x-ray microdiffraction device has been applied to study the spatial distribution of residual lattice strain. White x-ray radiation from a tungsten tube is collimated by pinhole diaphragms of 100 μm diameter or less to form a narrow primary beam spot. The specimen is mechanically scanned with a computer-controlled x-y stage under the stationary primary beam, and from each sampling grid point the diffracted intensities are acquired with an energy dispersive spectrometer system. As a result of residual lattice strain in the probed volume the diffracted beams are shifted as well as broadened on the energy scale. Line-profile analysis by Gauss peak modeling has been performed to determine the widths and positions of the diffraction peaks. The results are distribution maps of residual strain for selected hkl reflections, in addition to crystal texture maps. With this preliminary setup relative lattice compressions and expansions down to about 4.10 -4 can be resolved with a spatial resolution of 0.1 mm. An illustrative example is provided by residual strain maps as well as crystal texture maps of a rivet made of aluminum.
Published Version
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