Abstract
AbstractThe chemical state sensitive imaging of Ag/Si (111) using Ag 3d core photoelectrons was tried using a spectroscopic photo emission and low energy electron microscopy at SPring‐8. XPS spectrum obtained from the two‐dimensional (2D) Ag/Si(111) √3 × √3 structure exhibits the chemical shift of about 0.5 eV toward the higher binding energy with respect to that from the three‐dimensional (3D) Ag(111) island with 1 × 1 structure. The direct imaging of the difference in the chemical bonding state between the 3D and 2D structure has been tried, but it was not easy because the XPS signal from the 3D island was fairly larger than that from the 2D layer. The XPEEM images relative to a reference image taken in between XPS peaks of the 3D and 2D structures made the visualization of the different chemical state possible. Copyright © 2008 John Wiley & Sons, Ltd.
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