Abstract
The switching current of the PZT domain patterns was detected by the conductive atomic force microscopy. The impact of the scan rate on the current contrast was studied. Successive current images of domain evolution during the polarization switching process were obtained. The impact of the local force exerted by the tip and the polarization cycles of the patterns were studied. The results suggested that the compressive strain exerted by the tip can decrease the piezoelectric coercive field and the polarization fatigue can increase the piezoelectric coercive field in the polarization inversion process from bottom to top.
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