Abstract
Pseudomorphic growth of thin elemental metal films is often observed on a variety ofcrystalline solids. On quasicrystalline surfaces with their complex structure and the absenceof translational periodicity, the situation is different since elemental metals do not exhibitquasicrystalline order, and hence the specific interaction between overlayer and substrate isdecisive. Here we study the growth of manganese films on an icosahedral i-Al–Pd–Mn alloywith a view to establishing the growth mode and electronic structure. Although weobserve an exponential intensity variation of the adlayer and substrate related x-rayphotoemission spectroscopy (XPS) peaks, low energy electron diffraction (LEED)shows that Mn adlayers do not exhibit quasicrystallinity. The detailed structure ofthe Mn 2p core level line reveals considerable electronic structure differencesbetween the quasicrystalline and elemental metal environment. Evidence of asubstantial local magnetic moment on the Mn atoms in the overlayer (about 2.8 µB) is obtained from the Mn 3s exchange splitting.
Published Version
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