Abstract
Thin films of Pr0.5Ca0.5MnO3 were fabricated on (001) oriented SrLaAlO4, NdGaO3, and SrTiO3 substrates using a hybrid solution route and spin coating techniques. Good crystalline and epitaxial quality of the films was confirmed with X-ray diffraction and transmission electron microscopy studies. Strain in the film grown on NdGaO3 substrate did not relax during annealing process and the film exhibited charge-ordered insulator phase at low temperatures even with magnetic fields up to 9 T. However, the films on SrLaAlO4 and SrTiO3 substrates (with partially relaxed compressive and tensile strain, respectively) displayed melting of the charge-ordered phase with applied magnetic fields of less than 5 T. The results suggest that strain-relaxation rather than only the type of strain plays an important role in lowering critical melting magnetic fields in these films.
Published Version
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