Abstract
The metal–organic deposition method (MOD) fabricated cerium-substituted yttrium iron garnet (Ce:YIG, CexY3-xFe5O12) films with chemical composition Ce : Y : Fe=1.0:2.0:5.0. We determined the components of the dielectric tensor by measuring the transmittance and reflectance of circularly polarized light. These values are smaller than those obtained by other fabrication methods. Measurements of the cross-section of the samples using scanning electron microscopy (SEM) revealed the layered structures in the backscattered electron (BSE) image, which resulted from the traces of the spin-coating process of the MOD liquid. Energy dispersive X-ray spectroscopy (EDS) measurements revealed a chemical composition of x=0.7. Thus, we consider the small values of the components as the defects in the Ce:YIG crystals and low substitution ratio.
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