Abstract
An instrument for measurement of the low frequency magnetic properties of thin layers is described. The difference signal from two opposed pick-up coils, one of which contains the sample, is amplified, integrated, and amplified again to cause the vertical deflection of a cathode-ray oscillograph to be proportional to the intensity of magnetization of the specimen. A signal is applied to the horizontal deflecting plates of the oscillograph to cause it to represent the applied magnetizing field in the region of the pick-up coils. A large reduction in low frequency noise in the difference signal preamplifier is accomplished by use of a circuit similar to electrometer tube circuits. Noise introduced through integration of sharp peaked signals is reduced by use of first and third harmonic components in the magnetizing field current. A signal equal to noise is produced by a flux change of 75×10−6 maxwell.
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