Abstract
We have investigated the magnetic and photomagnetic properties of microcrystalline Cd 1-xMn xTe prepared by rf sputtering. Magnetization measurements were carried out using an rf SQUID magnetometer in the temperature range of 1.8 to 300 K at various magnetic fields up to 5.5 T. For temperatures above 40 K, the sample showed Curie-Weiss behaviour with a Curie temperature indicating predominantly antiferromagnetic interactions. A spin-glass phase transition was also observed. Photomagnetization measurements were performed using a fibre-optic system. The light was shone onto the sample utilizing an optical fibre and the subsequent change in the magnetization was sensed by the SQUID. Photo-induced magnetization was observed when the sample was illuminated by unpolarized light. Our results enable qualitative and quantitative conclusions to be drawn on the magnetic behaviour and the interplay between optical and magnetic properties of the diluted magnetic microcrystalline semiconductors. PACS: 68.55.Gi; 75.50.Pp.
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