Abstract

The Euler homogeneity relation expresses how a homogeneous function transforms under scaling. When implemented, it helps to determine source location for particular potential field anomalies. In this paper, we introduce an additional relation that expresses the transformation of homogeneous functions under rotation. The combined implementation of the two equations, called here extended Euler deconvolution for 2-D structures, gives a more complete source parameter estimation that allows the determination of susceptibility contrast and dip in the cases of contact and thin‐sheet sources. This allows for the structural index to be correctly chosen on the basis of a priori knowledge about susceptibility and dip. The pattern of spray solutions emanating from a single source anomaly can be attributed to interfering sources, which have their greatest effect on the flanks of the anomaly. These sprays follow different paths when using either conventional Euler deconvolution or extended Euler deconvolution. The paths of these spray solutions cross and cluster close to the true source location. This intersection of spray paths is used as a discriminant between poor and well‐constrained solutions, allowing poor solutions to be eliminated. Extended Euler deconvolution has been tested successfully on 2-D model and real magnetic profile data over contacts and thin dikes.

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