Abstract
AbstractFeNiN thin films with a Ni content varying between 5 and 36 at% (as determined by X‐ray photoelectron spectroscopy) have been deposited in a Dual Ion Beam Sputtering System at room temperature. The structure and crystalline size were studied by X‐ray diffraction while the magnetic properties were investigated by vectorial kerr magnetometry. In general, the deposited films present a nanocrystaline cubic structure and well defined in‐plane magnetic anisotropy. The variation of the magnetic properties was attributed to changes in composition and nanocrystalline structure. FeNiN thin films with a Ni content of about 15 at% show the better soft magnetic properties with a minimum in the coercivity of 9 Oe. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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