Abstract
X-ray and transmission electron microscopy structural investigations were performed as well as elastoresistance and magnetoresistance measurements on polycrystalline nickel thin films, sputtered by r.f. and d.c. methods, at different stages of annealing. Shape magnetic anisotropy, related to the plate-like morphology of the crystallites, seems to prevail in the as-deposited r.f. sputtered nickel films, while it is absent in d.c. films.
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