Magnetic penetration depth measurements in low and high Tc thin film superconductors at microwave frequencies

Abstract

The microstrip resonator technique can be used to measure the absolute value and temperature dependence of λ(T) in superconducting thin films. The zero temperature penetration depth is sensitive to the microstructure and orientation of the grains in the oxide superconducting films. The microstrip transmission line technique allows one to precisely measure the low temperature dependence of λ(T) and provides a means for extracting an energy gap Δ(0) of the superconducting films.