Abstract
The results of measuring the magnetization M and magnetic susceptibility χ of Cd1−xZnxTe crystals are presented. The hysteresis of the M(H) dependence, which is caused by the presence of arbitrarily oriented magnetic clusters, is observed in magnetic fields H<2 kOe. Van Vlek paramagnetism, which is caused by electric fields of defects, makes a substantial contribution to the magnetic susceptibility. The anomalies in the χ(T) dependence in the temperature region T<50 K are associated with variation in the charge state of interstitial Te for x=0.12. For x=0.21, these anomalies can be caused either by the paramagnetism of noninteracting defects or by antiferromagnetic ordering of the defect subsystem formed by ZnCd and Tei. The effect of annealing on the magnetic state of a defect subsystem in the samples is ascertained.
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