Magnetic force microscopic analysis and the magnetoelectric sensor of PLZT – Spinel ferrite composite films

Abstract

Abstract Composite films of Pb0.93La0.07Zr0.6Ti0.4O3 (PLZT) with spinel ferrites viz. Ni0.6Zn0.4Fe2O4 (NZFO), Co1.1Mn0.1Fe1.8O4 (CMFO), and Co0.9Zn0.1Fe2O4 (CZFO) respectively, were synthesized by the sol-gel spin coating technique. The layered structure of PLZT and spinel ferrite has been deposited onto silicon (1 1 1) substrate. X-ray diffraction analysis was used to confirm the formation of required phases in the light of JCPDS data. Microstructural investigation carried out using Magnetic Force Microscopy (MFM) operated topography mode depicts presence of grains having size of about 20–25 nm. The dielectric properties of the samples under investigation were recorded in the wide range of temperature measurements, in order to confirm existence of well grown ferroelectric phase and understand phase transition behavior. The magnetoelectric interactions have been investigated using phase signal of Magnetic Force Microscopy (MFM). Variation of MFM phase contrast and phase angle have been investigated as a function of electric field applied between magnetic tip and substrate, which gives an idea about nature of magnetoelectric interactions. The change in the magnetic domain as a function of applied electric field has been used to understand the magnetoelectric interactions present in the layered thin films of PLZT and spinel ferrite composite structure. Maximum phase angle change of 80°, 100° and 18° has been observed in the composite films of PLZT-NZFO, PLZT-CMFO and PLZT-CZFO respectively in presence of the applied voltage of 5 V/−5 V with respect to 0 V. Maximum value of magnetoelectric coefficient estimated for composite films of PLZT and NZFO composite was found to be 98 mV/cm Oe amongst the sample under investigation.