Abstract

Techniques to analyze the surface of magnetic memory devices with high spatial resolution are very important to develop today's information technology. The magnetic exchange force is an interaction between spins and is very important for analyzing magnetic properties. Magnetic exchange force microscopy (MExFM), which can detect the magnetic exchange force between the magnetic tip and the magnetic surface, has achieved the atomic-resolution imaging of the spin state on anti-ferromagnetic surface of NiO(001) [1]. In MExFM, however, the separation between a structure and a magnetic state on the surface has not been performed.Here, we propose a new MExFM using ferromagnetic resonance to separate the magnetic and non-magnetic tip-sample interaction. In this method, magnetic tip apex is irradiated by the frequency-modulated microwave with the frequency of ferromagnetic resonance. The magnetization of magnetic tip apex is modulated from on resonance to off resonance. Tip-sample interaction is measured with frequency modulation method. Magnetic images are obtained by detecting the modulation component of the frequency shift of the oscillating cantilever using a lock-in amplifier. Topographic images are obtained by the feedback signal for the constant tip-sample interaction. As a magnetic tip, magnetic cantilever tip coated with FePt with a high coercivity was used to detect the magnetic exchange force without an external magnetic field [2]. We performed imaging on antiferromagnetic material NiO(001) surface (Fig.1(a)) by MExFM using ferromagnetic resonance. We obtained spin selective image in atomic resolution (Fig.1(b)). This is the first demonstration of magnetization modulation of the magnetic tip apex using ferromagnetic resonance as well as the separation of the magnetic and non-magnetic tip-sample interaction in MExFM.jmicro;63/suppl_1/i11-a/DFU053F1F1DFU053F1Fig. 1.(a) Structure of NiO(001) surface and (b) its image (phase) obtained with MExFM using ferromagnetic resonance. (4 nm x 4 nm).

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