Magnetic field gradient measurement on magnetic cards using magnetic force microscopy

Abstract

The magnetic field gradients of magnetic stripe cards, which are developed for classifying magnetic particles used in magnetic particle inspections, have been measured using a magnetic force microscope (MFM). The magnetic force exerted on a MFM probe by the stray field emanating from the card was measured to determine the field gradients. The results are in good agreement with the field gradients estimated from the magnetizing field strengths used in the encoding process.