Abstract
The micro/nanomagnetic behavior of magnetic systems is a key issue as the size of magnetic devices is reduced to or under the micrometer range. We study the magnetic behavior of nanomagnets under different applied magnetic field conditions by Magnetic Force Microscopy (MFM). MFM is sensitive mainly to magnetization distributions that generate magnetic fields. CoCr Magnets were deposited by electropulsed SPM onto a Si substrate with sizes ranging from 400×100 to 800×400 nm and thickness between 2 and 3 nm. MFM measurements were performed using a Digital Instruments (DI) Dimension 3100 SPM upgraded for measurements with an external magnetic field applied to the sample. The home-designed modification consists in an electromagnet with field guides towards the scanning region while measuring. Different magnetic fields up to 400 Oe were applied to the samples in-plane during the MFM measurements. The magnetic configuration for the different applied fields was then imaged by MFM.
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