Abstract
The stray flux manifestations of surface magnetic domains found in as-grown Nd2Fe14B single crystals were observed, with a resolution in the range of 1 μm, using conventional scanning electron microscopy (SEM) without instrumental modifications. A modified image-distortion mode was applied to image the three-dimensional stray flux emanating from the sample. The simplicity of the technique and the ready adaptability of the SEM to such modifications as in situ current and magnetic field application suggest that the results of this study may be extended to investigations of other materials of technological interest, such as perpendicular media disks.
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