Abstract
ABSTRACT This paper will present a visual language for Integrated Circuit (IC) test. It abstracts the test flow as several classes whichmap to some forms. Test engineers can use the form-based environment which reduces the costof developing high quality programs.Test classes are defined by AT&T C++ 2.0. Forms are implemented by X-Window. All the system runs on SUN SPARCworkstation.Keywords: object-oriented programming, visual language, IC test program 1. Introduction While the computer hardware underwent revolution after revolution, using faster and ever more powerftil components, the software technology has significantly lagged behind in watching these advances. It is the same thing in the field of ICtest. As VLSI devices become more complex, VLSI device testing becomes more costly and more time consuming. Most conventional test languages are the extension of procedure-oriented languages such as C and PASCAL. Testengineers must know the details of Automatic Test Equipment (ATE) if they want to create high quality test programs.But the more complex of test system and IC, the more difficultly the test engineers meet the needs. In this paper, an
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