<title>Analysis of defects in ceramics through photothermal deflection method</title>

Abstract

A discussion about the photodeflection capability to detect layers and defects is presented. A 1D and 3D numerical analysis has been performed. In particular for the 3D case, a model based on the analog circuit method is applied to describe (surface or volume) defects and nonhomogeneities in materials, which can be detected through the photothermal deflection method. Experimental results are also discussed.