Abstract
The multiple-node upset (MNU) phenomenon caused by charge sharing increases rapidly in advanced nano-scale latches, making it more critical to design hardened latches for MNU. This paper proposed a low overhead quadruple-node upset self-recoverable latch based on a triple-mode redundancy latch named LQNTL, which consists of three modules with data feedback interlocking within each module to achieve high reliability. Simulation results show that the proposed LQNTL reduces power consumption, delay, PDP, and area by 69.76%, 6.35%, 71.68%, and 10%, respectively, compared to the latest soft-error tolerant latch of the same fault tolerance. The analysis of PVT variation shows that the LQNTL is more stable for the process corner, supply voltage, and temperature variations.
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