Low-frequency critical current noise in graphene Josephson junctions in the open-circuit gate voltage limit

Abstract

We investigate critical current noise in short ballistic graphene Josephson junctions in the open-circuit gate-voltage limit within the McWorther model. We find flicker noise in a wide frequency range and discuss the temperature dependence of the noise amplitude as a function of the doping level. At the charge neutrality point we find a singular temperature dependence T^{-3}, strikingly different from the linear dependence expected for short ballistic graphene Josephson junctions under fixed gate voltage.