Abstract
The method of low-temperature scanning laser microscopy is applied to visualize the resistive state in individual superconducting filaments extracted from (Bi, Pb)2Sr2Ca2Cu3O10+x/Ag tapes. This technique is capable of imaging the distributions of the critical currents over a sample. Using the nonbolometric response, a spatial resolution of about 1 μm is demonstrated for 10-μm-thick filaments. Some of the resistively visualized grain boundaries between crystallites show Josephson behavior.
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