Low temperature oxidation mechanisms of nanocrystalline magnetite thin film

Abstract

A detailed investigation of the mechanisms related to the low temperature oxidation of nanocrystalline magnetite thin films into maghemite is presented. Despite strong differences in the functional properties of these two phases, structural similarities make it difficult to distinguish between them, and to quantify the oxidation process, particularly in the case of nanostructured polycrystalline layers. Contrary to the case of bulk materials or monocrystalline films and particles, the oxidation processes in nanocrystalline thin film have only scarcely been studied. In this work, structural and optical techniques, including X-ray diffraction (XRD), EXAFS/X-ray absorption near edge structure, FTIR, and Raman scattering, have been used to estimate the oxidation rate of magnetite. The overall oxidation reaction rates are discussed in the framework of two limiting cases corresponding to intra grain diffusion and to grain boundary diffusion. SIMS profiling and electrical measurements were also carried out to better assess the oxidation quantification in order to conclude on the predominant oxidation mechanisms in this heterogeneous material. We propose a qualitative model for the structure, in terms of insulating zone distribution, for partially oxidized films.