Abstract
The noise suppression in solid state space charge limited diodes is calculated in two ways. In the first theory the noise in the open-circuited diode is attributed to carrier density fluctuations in the potential minimum. This gives an expression for the noise that contains an unknown parameter. In the second theory the noise in the short-circuited diode is considered as a convection current fluctuation in the potential minimum that is partly suppressed by corresponding fluctuations in the depth of the potential minimum. This gives an expression for the noise that does not contain any unknown parameter. The results indicate that the noise of the device is much less than thermal noise of the differential conductance of the device, and that the noise resistance R n of the device has the low value R n = 1 2 ( kT qI a) . G80 G80 V
Published Version
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