Abstract
It has been found that the high-Tc rf superconducting quantum interference devices (SQUIDs) with oxygen-ion-irradiated weak links show white noise spectrum down to frequencies of about 0.2 Hz. The observed noise at lower frequencies is Lorentzian with a characteristic time constant of about 30 s. In contrast, in SQUIDs fabricated from pre-irradiated and thermal annealed films, the measured noise power scaled as 1/ f. This fact is explained as a result of defect generation in YBa2Cu3O7. The study can provide a new insight into the microscopic origin of the 1/ f noise in high-Tc SQUIDs, because the observed 1/ f noise in the high-Tc SQUID is caused by introduced defects.
Published Version
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