Abstract
Low energy ion beam bombardment of ethylenetetrafluoroethylene (ETFE) modifies the physical and chemical properties of the polymer surface in ways that enhance or compromise applications in the technological and medical physics fields. When a material is exposed to ionizing radiation, its changes depends on the type, energy and intensity of the applied radiation. In order to determine the nature of the induced radiation changes, ETFE films were bombarded with fluences from 1012 up to 1015ions/cm2 of keV N and protons. The emission of gaseous species during the bombardments was monitored with a residual gas analyser (RGA). The bombarded films were analysed with optical absorption photospectrometry (OAP), Fourier transform infrared (FTIR) and micro-Raman spectrometries that determine the chemical nature of the structural changes caused by ions bombardment.
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