Abstract
The phase transition of Si(111) surface from the reconstructed low-temperature (7x7) phase to the high-temperature (1x1) phase has been studied by using Low Energy Electron Microscopy (LEEM) and Low Energy Electron Diffraction (LEED) technique. Our experimental results confirm that the phase transition is of first order. Further, our results also show these phase transitions to be reversible. In the LEEM, we observe thattriangular (7x7) domains nucleate from the terrace edges and cover almost total surface when the temperature is reduced from the transition temperature. Surfaces that are quenched from very high temperature does not transform to (7x7) structure completely because of the destruction of mechanical stress on the surface.
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