Abstract
Using a low-energy (0–5 eV) electron backscattering technique based on a hypocycloidal electron spectrometer with high energy (∼50 meV) and angular (∼1–5°) analyzer resolution, the specific features of the energy distribution of the density of electron states in magnesium films are investigated. The proposed technique enables not only the details of the distribution of the filled electron states density of as-prepared films, but also the evolution of surface electron states in process of film exposure to the residual-gas atmosphere to be studied.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Electron Spectroscopy and Related Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
