Abstract
A low cost microcomputer-based data-acquisition system designed specifically to perform transport characterization of high-Tc superconductors is presented. It can measure the temperature dependence of both the resistance and the critical current. It utilizes the four-point ac in-phase method to eliminate the effects of lead and contact resistance and thermal voltages. Some of the advantages of this method over dc methods are pointed out. The system is implemented on a PC (IBM or compatible) through the IEEE-488 interface. The temperature is controlled by the system with resolution and accuracy of 0.1 and ±0.5 K, respectively, which are the limits of the platinum thermometer used. Voltages in the sample can be measured with a resolution better than 5 nV. The system can be easily modified to measure the critical current dependence on an applied magnetic field.
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