Abstract

Using a novel attenuated total reflection (ATR) method, long-range surface modes (LRSMs) supported by SiO 2–Ag composite films were studied systematically by varying the thicknesses of the SiO 2–Ag composite layer ( d) and coupling-gap layer ( h). Systematic changes in the ATR spectra depending on d and h were observed successfully. The observed d and h dependences were in good qualitative agreement with electromagnetic calculations based on the theory of multiple reflections.

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