Long-term reliability of Al-free InGaAsP/GaAs (λ=808 nm) lasers at high-power high-temperature operation

Abstract

We report the long-term reliability measurement on uncoated Al-free InGaAsP/GaAs (λ=808 nm) lasers at high-power and high-temperature operation. No degradation in laser performance has been observed for over 30 000 h of lifetime testing in any of randomly selected several 100-μm-wide uncoated lasers operated at 60 °C with 1 W continuous wave output power. This is the first and the most conclusive evidence ever reported that directly shows the high long-term reliability of uncoated Al-free lasers.