Abstract
Carrier transport and electrical properties are relevant to the performance of semiconductor materials and photovoltaic devices. In recent years, various kinds of high-resolution luminescence-based methods have been proposed to image these properties. Lock-in carrierography (LIC), as a dynamic photoluminescence-based method, has the advantages of self-calibration, higher signal to noise ratio than dc or transient modalities, and high-frequency imaging ability. At the present stage of development, LIC has evolved into homodyne lock-in carrierography and heterodyne lock-in carrierography. In this Perspective, we discuss the principles and theoretical background of both LIC modalities and review experimental systems and methods. In addition, we also provide a brief overview of key LIC applications and future outlook.
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