Abstract

Understanding the single event effects (SEE) sensitivity of microelectronic devices and circuits is essential for long-term mission success in ionizing radiation environments. SEEs occur when a single ionizing particle strikes a device with enough energy to cause anomalous malfunction or even a catastrophic failure event. It is conventionally viewed as an electrical phenomenon, whereas this study investigates the possible role of multi-physics. Specifically, we show that localized mechanical stress in electronic devices significantly impacts the degree of SEE sensitivity. We present a technique that indirectly maps both electrical and mechanical field localization to spatially map SEE sensitivity without any need for radiation test sources. It is demonstrated on the operational amplifier LM124 under both pristine and stressed conditions. To validate our hypothesis, our experimental results are compared with those obtained from the well-established pulsed laser SEE technique. Excellent agreement between these results supports our hypothesis that SEE susceptibility may have fundamental roots in both electrical and mechanical fields. Therefore, the ability to map the localizations in these fields may indirectly map the SEE sensitivity of large area electronics, which is very expensive in time and resources.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.