Abstract
Structured materials like photonic crystals require for optimal use a high degree of precision with respect to both position and optical characteristics of their components. Here we present a simple tomographic algorithm, based on a specific Green's function together with a first-order Born approximation, which enables us to localize and characterize identical defects in finite-sized photonic crystals. This algorithm is proposed as a first step to the monitoring of such materials. Illustrative numerical results show in particular the possibility of focalization beyond the Rayleigh criterion.
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