Abstract
The structure of crystallized GeTe films has been studied by x-ray absorption fine structure spectroscopy. We find that in addition to Ge–Te bonds (2.20 and 3.13 Å) ∼10% of Ge–Ge bonds are present. Our results indicate that the crystallized GeTe film consists of GeTe crystallites with 10% Ge vacancies, separated by a quasiamorphous-Ge phase.
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