Abstract

The present study deals with the local structure of amorphous TiO2 and Fe-doped TiO2 thin films deposited on Si substrate using magnetron sputtering. The absence of long range order is confirmed by grazing incidence x-ray diffraction and the short range order is studied using x-ray absorption near edge structure (XANES) measurements at Ti, Fe and O K-edges and Fe and Ti L3-edge. The XANES provides understanding about the electronic transition induced from the short range ordering and dependence of electronic hybridization of the central Ti-p orbitals with the Ti-d orbitals. The XANES measurements also show that maximum Fe doping concentration allowed to replace Ti is 2 at.% and after that separate phase starts appearing, which is consistent with simulation by ab-initio multiple scattering theory based code FEFF9. Ellipsometry measurements show gradual decrease in band-gap energy upto 2 at.% Fe doping from pristine TiO2, however a drastic decrease in band-gap energy is observed at 4 at.% or higher doping concentration due to formation of other phases.

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