Abstract
A dual probe, i.e., high resolution scanning piezo-thermal microscopy, is developed and employed to characterize the local piezoresponse and thermal behaviors of ferroelastic domains in multiferroic BiFeO3 thin films. Highly inhomogeneous piezoelectric responses are found in the thin film. A remarkably local thermal transformation across ferroelastic domain walls is clearly demonstrated by the quantitative 3ω signals related to thermal conductivity. Different polarization oriented ferroelastic domains are found to exhibit different local thermal responses. The underlying mechanism is possibly associated with the inhomogeneous stress distribution across the ferroelastic domain walls, leading to different phonons scattering contributions in the BiFeO3 thin film.
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