Abstract
In this research a planar anode-supported cell was tested over the period of 3700 hours. The investigated cell was tested as a part of six cells stack with standard power output 100 [W]. The aging test was conducted at 800oC and under constant current 19.4 A to provide 90 W of initial power output. After the operation subsequent post-test analysis of the selected cell microstructure has been conducted using combination of Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM). Obtained data was reconstructed into 3D images, based on which the microstructure parameters were obtained. The microstructure parameters were quantified at three different location in the selected cell; inlet (downstream), middle and outlet (upstream). The obtained results indicate strong non-homogeneous microstructure morphology change after long-term operation.
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