Abstract
A noncontact scanning probe microscopy method was used to probe local near-surface dielectric susceptibility and dielectric relaxation in polyvinyl acetate near the glass transition. Dielectric spectra were measured from 10(-4) to 10(2) Hz as a function of temperature. The measurements probed a 20 nm thick layer below the free surface of a bulk film. A significant change in the fragility index and moderate narrowing of the distribution of relaxation times were found in the near-surface layer. In contrast to results for ultrathin films confined on or between metallic electrodes, no reduction in the dielectric strength was found, inconsistent with the immobilization of slower modes.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
