Abstract
BackgroundIt has been observed clinically that the Z-effect is a potential cause of failure of an intramedullary nail with two cephalic screws. It describes the migration behavior of the cephalic screws in the femoral head. The primary objective was to examine different cephalic screw configurations and test the load distribution between them as a function of their relative placement and their relative movement in the nail. It has been hypothesized that different cephalic screw positions may have an influence on the stress in the implant and bone and therefore on implant failures, such as the Z-effect.MethodsTo quantify the load distribution of a dual cephalic screw intramedullary femoral nail (Citieffe, Calderara di Reno, BO, Italy), a finite element model of the femur, focusing on the loading of the cephalic screws, was prepared. Four different screw lengths (90–105 mm) were examined. The investigation considered the stresses and strains in the bone and implant as well as the relative movement of the screws.ResultsIf the inferior cephalic screw had a shorter length, then the superior one and the femoral nail had to bear higher loads. In that case, the “equivalent von Mises stress” increased up to 10 % at the superior cephalic screw and up to 5 % at the femoral nail. The analysis of the relative movement showed that sliding of the inferior cephalic screw occurred in the nail. The total movement ranged from 0.47 to 0.73 mm for the different screw configurations.ConclusionsThe stresses were distributed more equally between the two cephalic screws in the bone and the implant if a longer inferior screw was used. The stresses in the bone and implant were reduced with a longer inferior cephalic screw. Therefore, a configuration using a longer inferior cephalic screw is preferable for trochanteric fracture fixation with a dual cephalic screw intramedullary device.
Highlights
It has been observed clinically that the Z-effect is a potential cause of failure of an intramedullary nail with two cephalic screws
Dual cephalic screw implants may occasionally fail through the so called Z-effect [11,12,13] in which there is an opposite migration of the two cephalic screws during post-operative weight-bearing [12], with medial migration of the superior and lateral
While strain and stiffness appeared to be underestimated by the finite element (FE) analysis, local displacements were overestimated by about 25 % ± 21 %
Summary
It has been observed clinically that the Z-effect is a potential cause of failure of an intramedullary nail with two cephalic screws. It describes the migration behavior of the cephalic screws in the femoral head. The use of an intramedullary nail is associated with shorter operative time, less blood loss, and Intramedullary devices for the fixation of proximal femur fractures are available with single, dual, and two integrated lag screws. Dual lag screw designs may have a role for medially located trochanteric fractures or lateral fractures of the femoral neck and have demonstrated sufficient mechanical stability [6, 11]. Dual cephalic screw implants may occasionally fail through the so called Z-effect [11,12,13] in which there is an opposite migration of the two cephalic screws during post-operative weight-bearing [12], with medial migration of the superior and lateral
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