Abstract
In this paper, the linear dependencies of extended linear finite state machines (LFSMs) used as test pattern generators (TPGs) are examined. The TPG mechanism considered is a shift register whose initial portion is configured as an LFSM. This mechanism (LFSM/SR) can be used for pseudorandom and circuit-specific pseudoexhaustive test pattern generation. A formula is presented that relates the linear dependencies that can occur among the LFSM/SR cells with the characteristic polynomial of the LFSM. Previously, such an easily computable formula had only been established for Type-1 linear feedback shift registers (LFSRs). The generalization allows the fast determination of linear dependencies for any LFSM, including in particular Type-2 LFSRs and cellular automata.
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