Limits to fourier transform—ion cyclotron resonance mass spectrometry for atomic mass measurements

Abstract

The application of Fourier transform—ion cyclotron resonance to precision atomic mass measurements is considered including a computer analysis of several facets of ion motion in an ion cyclotron resonance mass spectrometry cell. Numerical methods were used in conjunction with the analytical equations of motion to model cyclotron motion, including the effects of inhomogeneities in the electric and magnetic fields. Limits on mass accuracy are discussed and results are compared with those of several other studies.