Lightweight Integrated Design of PUF and TRNG Security Primitives Based on eFlash Memory in 55-nm CMOS

Abstract

We present a lightweight, suitable for Internet of Things (IoT) devices, integrated design of physically unclonable function (PUF) and true random number generator (TRNG) based on embedded flash memory in 55-nm CMOS. In the proposed approach, the randomness in nonlinear ${I} - {V}$ characteristics and temporal current fluctuations of embedded flash memories are exploited to generate the dynamic and static entropies. Shared silicon in designing PUF and TRNG results in a very compact and energy-efficient topology. Experimental and simulation results demonstrate >10200 key space, 0.58-pJ/b energy efficiency for < 5% controllable bit error rate at 80 °C, up to 192.3-Mbps throughput, high Shannon entropy, and resiliency toward machine learning attacks. Accelerated aging measurements indicate stable physical unclonable function response after 900 min of baking at 85 °C.