Abstract
Thin films of chalcogenide glasses in a binary system of Se90X10 (X = Sb, In and Ag) have been prepared by the vacuum evaporation technique. Thermally stimulated current measurements have been made to find out the trap density in these materials. To study light-induced defects in these materials, white light of intensity 1200 lux is shown on the amorphous films in vacuum for different exposure times. It is observed that the density of traps increases with exposure time, indicating the appearance of light-induced metastable defects in these materials.
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