Abstract

Electric force microscopy was used to record the light-dependent impedance spectrum and the probe transient photoconductivity of a film of butylammonium lead iodide, BA2PbI4, a 2D Ruddlesden–Popper perovskite semiconductor. The impedance spectrum of BA2PbI4 showed modest changes as the illumination intensity was varied up to 1400 mW cm–2, in contrast with the comparatively dramatic changes seen for 3D lead–halide perovskites under similar conditions. BA2PbI4’s light-induced conductivity had a rise time and decay time of ∼100 μs, 104 slower than expected from direct electron–hole recombination yet 105 faster than the conductivity-recovery times recently observed in 3D lead–halide perovskites and attributed to the relaxation of photogenerated vacancies. What sample properties are probed by electric force microscope measurements remains an open question. A Lagrangian-mechanics treatment of the electric force microscope experiment was recently introduced by Dwyer, Harrell, and Marohn which enabled the calculation of steady-state electric force microscope signals in terms of a complex sample impedance. Here this impedance treatment of the tip–sample interaction is extended, through the introduction of a time-dependent transfer function, to include time-resolved electrical scanned probe measurements. It is shown that the signal in a phase-kick electric force microscope experiment, and therefore also the signal in a time-resolved electrostatic force microscope experiment, can be written explicitly in terms of the sample’s time-dependent resistance (i.e., conductivity).

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