Lifetime prediction of optocouplers in digital input and output modules based on bayesian tracking approaches

Abstract

Digital input and output modules are widely used to connect digital sensors and actuators to automation systems. Digital I/O modules provide flexible connectivity extension to numerous sensors and actuators and protect systems from high voltages and currents by isolation. Components in digital I/O modules are inevitably affected by operating and environmental conditions, such as high voltage, high current, high temperature, and temperature cycling. Because digital I/O modules transfer signals or isolate the systems from unexpected voltage and current transients, their failures may result in signal transmission failures and damages to sensitive circuitry leading to system malfunction and system shutdown. In this study, the lifetime of optocouplers, one of the critical components in digital I/O modules, was predicted using Bayesian tracking approaches. Accelerated degradation tests were conducted for collecting the critical performance parameter of optocouplers, current transfer ratio (CTR), during their lifetime. Bayesian tracking approaches, including extended Kalman filter and particle filter, were applied to predict the failure. The performance of each prognostic algorithm was then compared using accuracy and robustness-based performance metrics.